An IR spectrometer based on a Binary Zone Plate (BZP) is presented for dissolved gas analysis. The wavelength selective focal length of the BZP can effectively discriminate between wavelengths ranging from 800 nm to 8 μm, by adjusting the focus distance onto an aperture in the image plane from 19 mm to 200 mm. The aperture serves to pass focused radiation onto the detector. The BZP has a focal length of 50 mm for a design wavelength of 3 μm, with 400 zones. This design enables discrimination between all key fault gases present in oil impregnated high voltage equipment.
This work presents the design and simulation of a MEMS-controllable linear motion Fresnel Zone Plate (FZP). The focal length of an FZP is a function of incident wavelength. This principle can be used for separating wavelengths, enabling a spectrometer application. The FZP of this work is designed on a linearly moving MEMS actuator, enabling wavelength focusing onto a fixed image plane. The FZP is designed with 400 zones, which can focus wavelengths from 150 nm to 410 nm by moving on a distance of 1 mm.
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