High-resolution M4,5N4,5N4,5 Auger and M5 and valence-band photoelectron spectra of Ag, Cd, In and Sn, measured using X-ray excitation, are combined to yield the magnitude of Ueff, the Coulomb repulsion between two holes on the same atomic site. The extra-atomic relaxation contributions to Auger and photoelectron processes in these elements are determined by comparing the experimental results with atomic structure calculations. The relationship Ueff>>2W, where W is the width of the 4d band, holds for Cd, In and Sn and the M4,5N4,5N4,5 Auger spectra of these elements are in good agreement with multiplet structure calculations. Discrepancies between the observed and the calculated M4,5N4,5N4,5 spectra of Ag are interpreted in terms of its failure to satisfy the Ueff>>2W condition and the variation of Ueff with the final-state component of the Auger spectrum. It is suggested that the 3F4 component is able to decay into the Ag 4d band and is thus substantially broader than the other components of the Auger spectrum.
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