Co /CoO/Co polycrystalline film was grown on Si (001) substrate and magnetic properties have been investigated using in-situ magneto-optic Kerr effect during growth of the sample. Magnetic anisotropy with easy axis perpendicular to the film surface has been observed in top Co layer, whereas bottom layer was found to be soft
Role of a buried ultrathin amorphous interlayer on the growth of Co films on different metal substrates Abstract: Co film of 13 nm thickness has been deposited on native oxide (CoO) layer using electron beam evaporation technique. CoO (fcc) of 2.3 nm thickness has been prepared by oxidizing surface of 50 nm thick Co (fcc) by thermal annealing. The structure of the sample has been investigated in detail using in-plane and out-of-plane energy dispersive grazing incidence x-ray diffraction (GIXRD) at EDXRD beamline, Indus-2, RRCAT, Indore. It is found that the growth of the Co film takes place with preferential orientation of c-axis perpendicular to the film plane, which results in structure induced magnetic anisotropy with easy axis normal to the film plane. FIGURE 1: a) out of plane and b) in-plane ED-XRD. q =4SSinT/O is the momentum transfer vector Solid State Physics:
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.