Tbe negative time+f-flight secondary ion mass spectrometry spectrum of a trimethylsiiylatd silicon oxide surface d positive ioo spectra of polymetbylrnetl~a~late (PMMA) surfaces before and after treatment with an oxygen plasma are presented. The speetra were recorded with a SIMS spectrometer equipped with a Reflectroo-type mass aanlyser. This instrument exhibits a mass resolution high eaougb to be able to determine the chemical composition of tbe seeomluy ioosl directly from the spectra .ad to resolve peaks of oxygen and noasxygen-coataining ions with mass W e r e n c e s of about 0.030 amu at ma58e8 well above 200 amu.Tbis idormation 00 the chemical composition makes it possible to determine structures of the ions originating from tbe surfaces, which incresses insight into secondary ion formation processes. On the basis of the results from the plasma-treated PMMA surface, a teatative mechanism is given for the interaction of an oxygen plasma with PMMA in which formstion of new polymer chpipeods containing acetyl group plays an important role.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.