A camera designed for in situ synchrotron radiation X‐ray topographic studies at high temperature and under ultra high vacuum (UHV) is described. Temperatures about 1000 K at 10−7 Pa can be easily reached with this equipment. Thus solid‐state phenomena in bulk samples (thickness 1 mm for aluminium) can be followed on a wide area (10 × 15 mm) by X‐ray topographs recorded on films or plates or using a TV camera. These performances are demonstrated in the case of aluminium recrystallization.
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