In this paper, constant–stress partially accelerated life tests (PALT) are considered for a product with the assumption that the lifetime of the product follows Weibull distribution with known shape parameter and unknown scale parameter. Based on data obtained using Type-II censoring, the maximum likelihood estimates (MLEs) of the Weibull parameters and acceleration factor are obtained assuming linear and Arrhenius relationships with the lifetime characteristics and stress. Exact distributions of the MLEs of the parameters of Weibull distribution are also obtained. Optimal acceptance sampling plans are developed using both linear and Arrhenius relationships. Some numerical results are also presented to illustrate the resulted test plans.
The concept of sequential order statistics were introduced by Kamps in 1995. In this article, we derive an acceptance sampling plan, for units having exponentially distributed lifetime, using sequential order statistics. Based on data obtained from progressive type II censoring using constant stress accelerated life tests, we obtain the maximum likelihood estimates of the parameters of the exponential distribution. Further, a log linear life-stress relationship is assumed to derive the exact distributions of the estimators of the parameters of exponential distribution. The parameters of the sampling scheme are obtained by minimizing expected total testing cost satisfying usual probability requirements. Some numerical results are presented in a table to illustrate our plans.
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