The problem of optimizing accelerated production testing is a pressing one in most electronic manufacturing facilities. Yet, practical models are scarce in the literature, especially for testing high volumes of electronic circuit packs in failure-accelerating environments. In this paper, we develop both a log-linear and linear model, based initially on the Weibull distribution. The models developed are suitable for modeling accelerated production testing data from a temperature-cycled environment. The model is "piecewise" in that the failures in each discrete "piece" of the temperature cycle are modeled as if the testing was in parallel rather than sequential mode. An extra covariate is introduced to indicate age at the start of each piece. The failures in a piece then depend on the stress in the piece itself and the time elapsed to the start of the piece. This last dependence captures the influence of reliability growth and has the result of providing * Centre for Telecommunications Value-Chain Research. 555 Int. J. Rel. Qual. Saf. Eng. 2008.15:555-579. Downloaded from www.worldscientific.com by RUTGERS UNIVERSITY on 04/04/15. For personal use only. 556 T. Joyce et al.an alternative linear model to the log-linear one. The paper demonstrates a simpler use of Poisson regression. An application, using actual production data, is described. Uses of the Loglogistic, Logistic, Lognormal and Normal distributions are also illustrated.
This study describes the production sampling environmental stress test (PSEST) KEYWORDSEnvironmental stress testing, temperature cycling, Weibull regression, generalized linear models BACKGROUNDEnvironmental stress tests (ESTs) are commonly applied during the design and manufacture of telecommunications and electronic equipment to screen for design and manufacturing defects. In these processes, environmental stresses are applied to the units under test. Design EST (DEST) usually occurs during the product development process, with the objective of correcting design flaws, thereby "ruggedizing" the hardware. Production sampling EST (PSEST) is typically used as an in-line manufacturing check, often on a sampling basis, to precipitate and detect latent process-related defects, thereby eliminating so-called infant mortality failures. PSEST also provides early information on field performance and design improvement opportunities. DEST and PSEST procedures are conducted on optical-, copper-, and wireless-based network products.PSEST is the second part of a two-stage activity, with DEST as a prerequisite. Highly accelerated life testing (HALT) is a major part of DEST.3
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