PurposeThe purpose of this paper is to present a novel Sn7In4.1Ag0.5Cu/Plastic Core Solder Ball/Sn4Ag0.5Cu composite solder joint configuration for second‐level ball grid array (BGA) interconnections of low temperature co‐fired ceramic (LTCC) modules and the thermal fatigue durability of the configuration. The purpose of using the Sn7In4.1Ag0.5Cu solder was to increase the creep/fatigue resistance of critical regions on the LTCC side of the joint.Design/methodology/approachTest LTCC module/printed wiring board (PWB) assemblies were fabricated and exposed into temperature cycling tests over the 0 to 100°C and −40 to 125°C temperature ranges. The characteristic lifetimes of these assemblies were determined using DC resistance measurements. The failure mechanisms of the test assemblies were verified using scanning acoustic microscopy, FE‐SEM, and SEM investigation.FindingsThe test assemblies were exposed to thermal cycling tests (TCT) over test ranges of 0 to 100°C and −40 to 125°C, and characteristic lifetimes of over 5,500 and 1,400 cycles, respectively, were achieved. Compared with Sn4Ag0.5Cu/plastic‐core solder balls (PCSB)/Sn4Ag0.5Cu joints, the characteristic lifetime of the SAC‐In/PCSB/SAC joints increased over 55 per cent in the harsh (−40 to 125°C) TCT conditions. In the milder test conditions (0 to 100°C), the characteristic lifetime of the SAC‐In/PCSB/SAC joints increased 30 per cent compared with the SAC/PCSB/SAC joints.Originality/valueThe results proved that the enhanced creep/fatigue properties of the solder matrix resulted in satisfactory lifetime durations in the present lead‐free composite solder joints and, consequently, different primary failure mechanisms on the LTCC side due to the use of indium alloyed solder. Thus, the present joint configuration is assumed to be a promising solution for the further design of a reliable second‐level solder interconnection in LTCC/PWB assemblies with a high‐global thermal mismatch.

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The thermal fatigue endurance of completely lead-free 95.5Sn4Ag0.7Cu/ plastic core solder ball (PCSB) composite joint structures in low-temperature Co-fired ceramic/printed wiring board (LTCC/PWB) assemblies was investigated using thermal cycling tests over the temperature ranges of )40°C-125°C and 0°C-100°C. Two separate creep/fatigue failures initiated and propagated in the joints during the tests: (1) a crack along the intermetallic compound (IMC)/solder interface on the LTCC side of the joint, which formed at the high-temperature extremes; and (2) a crack in the solder near the LTCC solder land, which formed at the low-temperature extremes. Moreover, localized recrystallization was detected at the outer edge of the joints that were tested in the harsh ()40°C-125°C) test conditions. The failure mechanism was creep/fatigue-induced mixed intergranular and transgranular cracking in the recrystallized zone, but it was dominated by transgranular thermal fatigue failure beyond the recrystallized zone. The change in the failure mechanism increased the rate of crack growth. When the lower temperature extreme was raised from )40°C to 0°C, no recrystallized zone was detected and the failure was due to intergranular cracks.

Purpose -The purpose of this paper is to investigate the effect of electroless NiAu (ENIG) deposition on the failure mechanisms and characteristic lifetimes of three different non-collapsible lead-free 2nd level interconnections in low-temperature co-fired ceramic (LTCC)/printed wiring board (PWB) assemblies. Design/methodology/approach -Five LTCC module/PWB assemblies were fabricated and exposed to a temperature cycling test over a 2 40 to 1258C temperature range. The characteristic lifetimes of these assemblies were determined using direct current resistance measurements. The failure mechanisms of the test assemblies were verified using X-ray and scanning acoustic microscopy, optical microscopy with polarized light, scanning electron microscope (SEM)/energy dispersive spectroscopy and field emission-SEM investigation. Findings -A stable intermetallic compound (IMC) layer is formed between the Ni deposit and solder matrix during reflow soldering. The layer thickness does not grow excessively and the interface between the layer and solder is practically free from Kirkendall voids after the thermal cycling test (TCT) over a temperature range of 2 40 to 1258C. The adhesion between the IMC layer and solder matrix is sufficient to prevent separation of this interface, resulting in intergranular (creep) or mixed transgranular/intergranular (fatigue/creep) failure within the solder matrix. However, the thermal fatigue endurance of the lead-free solder has a major effect on the characteristic lifetime, not the deposit material of the solder land. Depending on the thickness of the LTCC substrate and the composition of the lead-free solder alloy, characteristic lifetimes of over 2,000 cycles are achieved in the TCT. Originality/value -The paper investigates in detail the advantages and disadvantages of ENIG deposition in LTCC/PWB assemblies with a large global thermal mismatch (DCTE $ 10 ppm/8C), considering the design and manufacturing stages of the solder joint configuration and its performance under harsh accelerated test conditions.

The thermal fatigue endurance of two lead-free solder/plastic-core solder ball (PCSB) composite joint structures in low-temperature co-fired ceramic (LTCC) modules was investigated using a thermal cycling test over a temperature range of À55°C to 150°C. The investigated solder alloys were Sn-7In-4.1Ag-0.5Cu (SAC-In) and 95.5Sn-4Ag-0.5Cu (SAC). Three failure mechanisms were observed in the test joints. Transgranular (fatigue) cracking mixed with minor intergranular cracking was the dominant failure mechanism at the outer edge of the joints in both test assemblies, whereas separation of the solder/intermetallic compound (IMC) interface and creep cracking occurred in the other parts of the test joints. The propagation rate of the transgranular crack was lower in the SAC-In joints compared with in the SAC joints. Furthermore, the SAC solder seemed to be more prone to separation of the solder/IMC interface, and more severe intergranular (creep) cracking occurred in it compared with in the SAC-In solder. In the thermal cycling test conditions, the better thermal fatigue endurance of the SAC-In solder composite joints resulted in a 75% higher characteristic lifetime compared with the SAC composite joints.