Nonlinear interactions between X-rays and long wavelength radiation can be used as a powerful atomic-scale probe for light-matter interactions and for properties of valence electrons. However, reported X-ray nonlinear effects were small and their observations required tremendous efforts. Here we report the observation of strong nonlinearities in parametric down-conversion (PDC) of X-rays to long wavelength radiation in gallium arsenide and lithium niobate crystals, with efficiencies about 4 orders of magnitude stronger than the efficiencies measured in any material studied before. Furthermore, we show that the efficiency in the ferroelectric phase of strontium barium niobite is two orders of magnitude stronger than in its paraelectric phase. This observation suggests that the lack of inversion symmetry is the origin for the strong observed nonlinearity. Additionally, we demonstrate the ability to use the effect for the investigation of the spectral response of non-centrosymmetric materials at wavelengths ranging from infrared to soft X-rays.

Chemical element mapping is an imaging tool that provides essential information on composite materials and it is crucial for a broad range of fields ranging from fundamental science to numerous applications. Methods that exploit x-ray fluorescence are very advantageous and are widely used, but require focusing of the input beam and raster scanning of the sample. Thus the methods are slow and exhibit limited resolution due to focusing challenges. We demonstrate a new focusing free x-ray fluorescence method based ghost imaging that overcomes those limitations. We combine our procedure with compressed sensing to reduce the measurement time and the exposure to radiation by more than 80%. Since our method does not require focusing, it opens the possibility for improving the resolution and image quality of chemical element maps with tabletop x-ray sources and for extending the applicability of x-ray fluorescence detection to new fields such as medical imaging and homeland security applications.

We demonstrate experimentally the ability to use a single-pixel detector for two-dimensional high-resolution x-ray imaging of fast dynamics. We image the rotation of a spinning chopper at 100 kHz and at spatial resolution of about 40 microns by using the computational ghost imaging approach. The technique we develop can be used for the imaging of fast dynamics of periodic and periodically stimulated effects with a large field of view and at low dose.

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We demonstrate a fast, simple, and high-resolution absorption spectroscopy approach for high photon energies with free-electron laser sources. The method fosters new possibilities for measurements of absorption spectra in complex samples especially for photo-induced phenomena.

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We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.

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