Fabrication and characterization of solution-processed methanofullerene-based organic field-effect transistors J. Appl. Phys. 97, 083714 (2005); 10.1063/1.1895466Pentacene organic field-effect transistor on metal substrate with spin-coated smoothing layer This paper reports on improvements of the field-effect mobility in regioregular head-to-tail coupled poly͑3-hexylthiophene͒ based transistors by mechanically induced alignment of polymer chains in the active layer. It is demonstrated that mechanical rubbing perpendicular to the source drain contacts can increase the field-effect mobility up to 800% whereas rubbing parallel to the source drain contacts results in a reduced mobility. The polymer alignment is thereby deduced from optically polarized transmission spectroscopy on polymer-coated quartz glass substrates and is shown to directly correlate with the electrical behavior of a bottom-gate field-effect transistor. The influence of layer thickness on rubbing is investigated and it is shown that annealing after mechanical rubbing at high temperature can further increase the alignment. Differences between thick drop-cast and thin spin-coated films are explained in terms of different solvent evaporation rates, allowing the material to order to a different degree. This interpretation is deduced from characteristic optical and electrical features of the differently prepared poly͑3-hexylthiophene͒ films.

We investigated the influence of a μ-pixelated chip process on the photoluminescence (PL) and electroluminescence (EL) of a monolithic InGaN/GaN based blue light emitting diode with a continuous n-GaN layer. Particularly, we observed the impact of the metallic p-contact on the PL emission wavelength. A PL wavelength shift in the order of 10 nm between contacted and isolated areas was assigned to screening of internal piezoelectric fields due to charge carrier accumulation. μPL and μEL mappings revealed correlated emission wavelength and intensity inhomogeneities, caused by the epitaxial growth process. The edges of single pixels were investigated in detail via resonant confocal bias-dependent μPL. No influence on the intensity was observed beyond 300 nm away from the edge, which indicated a good working edge passivation. Due to the low lateral p-GaN conductivity, the μPL intensity was enhanced at isolated areas.

Chemical impurities with known highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital energies were incorporated in organic hole transport materials. The effect of these dopants on quantity and depth of trap levels, transport properties, and luminescence of organic light emitting devices was examined. This was achieved by investigating current–voltage characteristics, luminance–voltage characteristics, and utilizing the method of thermally stimulated current for trap level detection. It was found that 4,4′,4″-tris-[N-(1-naphthyl)-N-(phenylamino)]triphenylamine (1-NaphDATA) doped into N,N′-di(1-naphthyl)-N,N′-diphenylbenzidine (α-NPD) generates a trap level whose activation energy corresponds to the HOMO energy difference between dopant and matrix molecules. Therefore, the detected electronic states can be assigned to hole traps. The influence of those traps on the charge transport will be reported. For doping α-NPD into 1-NaphDATA no new trap levels could be detected.

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Besides high-power light-emitting diodes (LEDs) with dimensions in the range of mm, micro-LEDs (μLEDs) are increasingly gaining interest today, motivated by the future applications of μLEDs in augmented reality displays or for nanometrology and sensor technology. A key aspect of this miniaturization is the influence of the structure size on the electrical and optical properties of μLEDs. Thus, in this article, investigations of the size dependence of the electro-optical properties of μLEDs, with diameters in the range of 20 to 0.65 μm, by current–voltage and electroluminescence measurements are described. The measurements indicated that with decreasing size leakage currents in the forward direction decrease. To take advantage of these benefits, the surface has to be treated properly, as otherwise sidewall damages induced by dry etching will impair the optical properties. A possible countermeasure is surface treatment with a potassium hydroxide based solution that can reduce such defects.