The effects of Bi/Ta and Sr/Ta mole ratios on ferroelectric properties of Sr x Bi y Ta2O z [ SBIT(x/y/2.0); 0.7≤x≤1.0, 2.0≤y≤2.6] thin-film capacitors were investigated. The SBIT films were grown by the sol-gel method using a spin-on coating on Pt/Ta/SiO2/Si and Pt/Ti/SiO2/Si substrates. The films were annealed at 800° C for one hour in oxygen atmosphere. Remanent polarization (Pr) depended strongly on the Sr/Ta mole ratio, and increased with decrease of the Sr/Ta mole ratio. On the other hand, Pr was almost independent of the Bi/Ta mole ratio. Scanning electron microscopy (SEM) images show that crystal grains grew with decrease of the Sr/Ta mole ratio. Electron probe micro analyzer (EPMA) analysis revealed that Bi content in SBIT films increased with decrease in Sr composition from stoichiometry.

According to two estimated relations between the initial period and the dynamo-generated magnetic dipole field of pulsars, we calculate the statistical distributions of pulsar initial periods. It is found that proto-pulsars are very likely to have rotation periods between 20 ms and 30 ms, and that most of the pulsars rotate initially at a period < 60 ms. Our result supports the asymmetric neutrino emission model for pulsar kick.

High energy x-ray diffraction measurements have been performed on CaO-Al 2 O 3 liquids suspended in a flow of pure argon for six compositions containing 50-67 mol% CaO. The results indicate that AlO 4 tetrahedra dominate the liquid structure. The radial distribution functions show a significant broadening of the Ca-O peak occurs in the liquid compared to the corresponding glass and, on average, each Ca is surrounded by approximately five oxygen atoms in the melt at a distance of 2.3Å. It is also found that the structure for the eutectic (64% CaO) liquid does not change measurably with temperature between 1600 and 1970 • C.

Surface morphology of lead-zirconate-titanate [PZT(52/48)] thin films prepared by sol-gel processing on Pt/Ti/ SiO2/Si substrates was studied. When the atomic ratio [Pb/(Zr+Ti)] of PZT gel films was 1, rosette structure was observed in the films after annealing at 600° C for one hour. The crystal structure of the rosette was identified as perovskite and that of the other area was nonperovskite, by electron diffraction analysis. Lead deficiency in the non-perovskite phase caused by lead diffusion into the bottom electrode was detected by energy dispersive X-ray spectroscopy and Auger electron spectroscopy. In order to prepare PZT films with a smooth surface, the following four means were efficient: addition of lead excess, rapid thermal annealing (RTA), adoption of buffer layer, and preparation of crystal nucleus on the substrate.