International audienceWe display a photonic embodiment of the Demkov-Ostrovsky solution to the crossing of two manifolds made of equidistant modes thanks to broad periodic waveguides. We find clearly narrowing resonances that signal the singular, flat dispersion case that we had termed "critical coupling." The reconciliation of band-edge confinement and cavity confinement, two pillars of photonics, appear from the guide length dependence of spectra. We suggest the generality of the Demkov-Ostrovsky or critical coupling flat dispersion across all kinds of waves, e. g., electronic and acoustic
An anomalous dispersion for modes of a material resonator is highly desired to form frequency combs. A resonator free-spectral-range (FSR) controlled by shape so as to increase with frequency ω/2π compensates the normal index dispersion ∂n/∂ω > 0, producing evenly spaced resonances. Only special shapes achieve this scope. We show here that broad periodic corrugated waveguides working at Littrow regime feature such an increasing trend ∂FSR/∂ω > 0. We outline experimentally this trend on silicon-on-insulator devices designed for 45° Littrow operation. We predict dispersion-free silicon-based designs across the 1.4–4.0 μm mid-infrared range.
Abstract:In experiments on nonlinear-optical transmission of picosecond laser pulses at the wavelength of 1.064 μm threeorder-of-magnitude enhancement of the photoinduced absorption in optically anisotropic mesoporous silicon films compared to crystalline silicon (c-Si) was found. The effect is not sensitive to the polarization of the laser radiation and it saturates at laser peak intensities about 5 MW/cm 2 . Higher laser intensity results in the polarization-sensitive photoinduced absorption, which is merely one-order-of-magnitude more effective than in c-Si. These efficient nonlinear-optical responses can be attributed to the resonant excitation of the defect states in the direct gap of silicon and local-field enhancement in the mesoporous films. Total transmittance of the birefringent mesoporous silicon film versus the laser intensity for the sample of 49% porosity. The crystallographic direction [001] corresponds to the optical axis
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