Nanowire lasers are sought for near‐field and on‐chip photonic applications as they provide integrable, coherent, and monochromatic radiation: the functional performance (threshold and wavelength) is dependent on both the opto‐electronic and crystallographic properties of each nanowire. However, scalable bottom‐up manufacturing techniques often suffer from inter‐nanowire variation, leading to differences in yield and performance between individual nanowires. Establishing the relationship between manufacturing controls, geometric and material properties, and the lasing performance is a crucial step toward optimisation; however, this is challenging to achieve due to the interdependance of such properties. Here, a high‐throughput correlative approach is presented to characterise over 5000 individual GaAsP/GaAs multiple quantum well nanowire lasers. Fitting the spontaneous emission provides the threshold carrier density, while coherence length measurements determine the end‐facet reflectivity. The performance is intrinsically related to the width of a single quantum well due to quantum confinement and bandfilling effects. Unexpectedly, there is no strong relationship between the properties of the lasing cavity and the threshold: instead the threshold is negatively correlated with the non‐radiative recombination lifetime of the carriers. This approach therefore provides an optimisation strategy that is not accessible through small‐scale studies.
Bottom-up grown nanostructures often suffer from significant dimensional inhomogeneity, and for quantum confined heterostructures, this can lead to a corresponding large variation in electronic properties. A high-throughput characterization methodology is applied to >15,000 nanoskived sections of highly strained GaAsP/GaAs radial core/shell quantum well heterostructures revealing high emission uniformity. While scanning electron microscopy shows a wide nanowire diameter spread of 540–60 +60 nm, photoluminescence reveals a tightly bounded band-to-band transition energy of 1546–3 +4 meV. A highly strained core/shell nanowire design is shown to reduce the dependence of emission on the quantum well width variation significantly more than in the unstrained case.
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