The direct manipulation
of individual atoms in materials using
scanning probe microscopy has been a seminal achievement of nanotechnology.
Recent advances in imaging resolution and sample stability have made
scanning transmission electron microscopy a promising alternative
for single-atom manipulation of covalently bound materials. Pioneering
experiments using an atomically focused electron beam have demonstrated
the directed movement of silicon atoms over a handful of sites within
the graphene lattice. Here, we achieve a much greater degree of control,
allowing us to precisely move silicon impurities along an extended
path, circulating a single hexagon, or back and forth between the
two graphene sublattices. Even with manual operation, our manipulation
rate is already comparable to the state-of-the-art in any atomically
precise technique. We further explore the influence of electron energy
on the manipulation rate, supported by improved theoretical modeling
taking into account the vibrations of atoms near the impurities, and
implement feedback to detect manipulation events in real time. In
addition to atomic-level engineering of its structure and properties,
graphene also provides an excellent platform for refining the accuracy
of quantitative models and for the development of automated manipulation.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.