The main purpose of this work is to establish a method of elemental analysis by Proton-Induced X-ray Emission (PIXE) technique on thick samples. Our study has been carried out at Hanoi University of Science (HUS) using a 5SDH-2 Tandem accelerator. The X-ray spectra were measured by a Si(Li) detector (FWHM = 139 eV at 5.9 keV) and analyzed off-line using GUPIX software. The validity of the proposed method has been checked through its application to NIST standard samples. The concentrations of the elements have been determined in the standard samples are in agreement with the certified values within the error limits. Our method is now used for the analysis of environmental samples at our laboratory
Stopping powers of \(\alpha\)-particles emitted by \(^{148}\)Gd, \(^{241}\)Am and \(^{243}\)Cm isotopes in PR10 and isobutane (C\(_{4}\)H\(_{10}\)+Ar) gases have been experimentally measured in the energy region from 1.0 to 5.5 MeV. The experimental data were compared with those calculated by SRIM-2013 computer code. It was concluded that the experimental stopping powers in our investigated region are in agreement with the calculated values.
This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data.
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