In this work, iron oxide (Fe2O3) and titanium oxide (TiO2) doping (Fe2O3) thin films have been prepared by spray pyrolysis technique (SPT) on a glass substrate. We have studied the effects of various doping percentage of (TiO2) on (Fe2O3) optical and electrical properties. The optical parameters of the prepared films as absorbance, absorption coefficient, optical energy gap and refractive index have been calculated for all prepared films. D.C conductivity and Hall effect for all films are measured. The results showed that absorbance of prepared films decreases with increasing percentage of (TiO2) this lead to increase the energy gap and conductivity decreased with increasing of percentage of (TiO2) as well as the results showed throughout the study that all films have tow activation energy, its value increase with increasing of percentage of (TiO2). Hall effect measurement showed all films have n-type conductivity.

In this paper, the design of spray pyrolysis system to prepare thin films of various materials system. The study showed that films prepared with good characteristics. films were prepared from lead oxide PbO this way. The study of the optical properties of these films and through recording the absorbance spectrum and transmittance spectrum of films prepared in the wavelength range (300-1100) nm . Optical constant for thin films prepared such as absorption coefficient, the extinction coefficient , the refractive index and the optical energy gap was calculated as well. films prepared found that it has a direct energy gap value 3.1eV.

ABSTRACT. CdO thin films have been deposited at different concentration of SnO 2 (x= (0.0, 0.05, 0.1, 0.15 and 0.2)) Wt. % onto glass substrates by pulsed laser deposition technique (PLD) using Nd-YAG laser with λ=1064nm, energy=600mJ and number of shots=500. X-ray diffraction (XRD) results reveal that the deposited (CdO) 1-x (SnO 2 ) x thin films cubic structure and the grain size increase with increasing annealing temperature and increasing concentration of SnO 2 . The optical transition in the (CdO) 1-x (SnO 2 ) x thin films are observed to be allowed direct transition. The value of the optical energy gap decreases with increasing of annealing temperatures and increase with increasing concentration of SnO 2 for all samples.

CdO thin films have been deposited at different concentration of SnO2 (x= (0.0, 0.05, 0.1, 0.15 and 0.2)) Wt. % onto glass substrates by pulsed laser deposition technique (PLD) using Nd-YAG laser with λ=1064nm, energy=600mJ and number of shots=500. X-ray diffraction (XRD) results reveal that the deposited (CdO)1-x(SnO2)x thin films cubic structure and the grain size increase with increasing annealing temperature and increasing concentration of SnO2. The optical transition in the (CdO)1-x(SnO2)x thin films are observed to be allowed direct transition. The value of the optical energy gap decreases with increasing of annealing temperatures and increase with increasing concentration of SnO2 for all samples.

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ABSTRACT. (NiO) 1-x (CuO) x Thin Films have been deposited on glass substrates by chemical spray paralysis technique for with different ratios at temperature (375±10) °C with spray rate 4s./1min. The structural properties of thin films have been investigated by the study of X-Ray diffraction analysis and morphological by study atomic forces microscope (AFM) . From the XRD result showed all simples are polycrystalline and various structural parameters were calculated. all the films show most preferred orientation along (111), (200) and (220) planes. The (AFM) results shows that the roughness decreases with mixing ratios.

Abstract-Nano structure of mixed (SnO2)

(NiO)1-x(CuO)x Thin Films have been deposited on glass substrates by chemical spray paralysis technique for with different ratios at temperature (375±10) °C with spray rate 4s./1min. The structural properties of thin films have been investigated by the study of X-Ray diffraction analysis and morphological by study atomic forces microscope (AFM) . From the XRD result showed all simples are polycrystalline and various structural parameters were calculated. all the films show most preferred orientation along (111), (200) and (220) planes. The (AFM) results shows that the roughness decreases with mixing ratios.