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Microdeformational behavior of oriented films of a polyamide 6 (PA-6) during reorientation at different angles α with respect to the initial orientation is studied by means of small-and wide-angle X-ray scattering techniques. It is shown that the crystallites of PA-6 can undergo a large shear deformation up to several tens of degrees. With increase of deformation temperature the shear angles decrease. The shear deformation of the crystallites manifests itself in the shift of small-angle reflections from the meridian of X-ray patterns along the direction of the layer lines. On wide-angle X-ray patterns a radial broadening of reflections from crystallographic (002) planes, on which intracrystalline shear slip, is seen. The shear deformation of PA-6 crystallites occurs with the greatest ease on a slip system (002) [010], i.e., along the direction of the macromolecule axes between planes containing intermolecular H-bonds. The H-bonds hinder the shear deformation of the crystallites, and after destruction of the initial structure, promote preservation of layers parallel to the macromolecule axes and containing the H-bonds. ORDER REPRINTS 208GINZBURG AND SULTANOV

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