Successful manufacturing ramp of a complex high speed microprocessor requires quick and reliable test and diagnostic methods. Some commonly used debug techniques for the UltraSPARC family of devices are presented with actual result of some diagnosed failures.necessary to develop and automate some key debug flows and procedures.The design-for-test features of the UltraSPARC designs are well defined in [ 1,2,4]. What is not as well documented is the actual usefulness of these features with regard to manufacturing and testing. The results presented in this paper show some of the successes that were achieved because of the strong test methodology in these designs.
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