Microstructural investigations of CoCrPtICr andCoCrPt/CrV magnetic thin film media were conducted in order to explain improved media performance as a function of increased Cr concentration in the magnetic layer and a predeposition treatment of the Nip plated AI substrate. Using High Resolution Transmission Electron Microscopy (HRTEM) and Selected Area Diffraction Patterns (SADP) it was found that for both underlayer structures, no significant microstructural differences (such as grain size, stacking fault density, orientation, crystalline phase, and bi-crystals) exist between samples grown with 13% Cr and 22% Cr. This indicates that Cr segregation to grain boundaries is the most likely mechanism for improved S/N ratio and higher coercivity. The increased coercivity observed in the treated samples is consistent with an increased grain size in the magnetic layer due to larger Cr underlayer grains
Polycrystalline CoPtCr/CrV(or Cr) thin films with different Cr concentrations were prepared by sputter deposition on Nip-plated A1 substrates. TEM images revealed the existence of bicrystal clusters. High field torque measurement was used to determine the intrinsic anisotropy constant. The M-H loop and torque hysteresis measurement coupled with micromagnetic modeling permitted determination of intergranular interactions. The cross-track correlation length was evaluated from micromagnetic noise calculation and compared well with the result from measured noise spectra. The physical implication of a bicrystal structure is discussed in general.
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