A new approach to enhancing the sensitivity for the reflection EXAFS signal is described. A method that uses the whispering gallery effect was realized in principle, implementing the optical guiding effect by a simple curved-mirror geometry. The multiple total reflection (MTR) phenomenon highly increases x-ray interaction with the waveguide surface and hence offers higher sensitivity compared to conventional (single reflection) REFL-EXAFS. The Ge K-edge REFL-EXAFS measurements were performed using both the MTR and conventional (single reflection) techniques for a GeO2 3 ,~, thick film grown on a silica mirror. The MTR technique allows one to achieve about 20-fold gain in the signal-to-background ratio compared to the conventional technique.
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