Abstract:We present a theoretical analysis to estimate the amount of phase noise due to noisy interferograms in Phase Shifting Interferometry (PSI). We also analyze the fact that linear filtering transforms corrupting multiplicative noise in Electronic Speckle Pattern Interferometry (ESPI) into fringes corrupted by additive gaussian noise. This fact allow us to obtain a formula to estimate the standard deviation of the noisy demodulated phase as a function of the spectral response of the preprocessing spatial filtering combined with the PSI algorithm used. This phase noise power formula is the main result of this contribution.
Abstract:It is well known that having 3 temporal phase shifting (PS) interferograms we do not have many possibilities of using an algorithm with a desired frequency spectrum, detuning, and harmonic robustness. This imposes severe restrictions on the possibilities to demodulate such set of temporal interferograms. It would be nice to apply for example a 7 step PS algorithm to these 3 images in order to have more possibilities to phase demodulate them; even further, it would be even better to apply a quadrature filter having a spatial spread given by a real number to these 3 interferograms. In this paper we propose to do just that; namely we show how to demodulate a set of M-steps phase shifting images with a quadrature filter having a real-number as spatial spread. The interesting thing in this paper is to use a higher than M spread quadrature filter to demodulate our interferograms; in traditional PS interferometry one is stuck to the use of M step phase shifting formula to obtain the searched phase. Using a less than M PS formula is not interesting at all given that we would not use all the available information. The main idea behind the "squeezing" phase shifting method is to re-arrange the information of the M phase shifted fringe patterns in such a way to obtain a single carrier frequency interferogram (a spatio-temporal fringe image) and use any two dimensional quadrature filter to demodulate it. In particular we propose the use of Gabor quadrature filters with a spread given by real-numbers along the spatial coordinates. The Gabor filter may be designed in such way that we may squeeze the frequency response of the filter along any desired spatio-temporal dimension, and obtain better signal to noise demodulation ratio, and better harmonic rejection on the estimated phase.
In this work we analyze the frequency response, the spatial distribution and continuity of the recovered phase in Lateral Shearing Interferometry (LSI). This frequency content and topology of the recovered phase is analyzed for the forward LSI operator as well as its inverse LSI operator using one, two, or n two-dimensional sheared interferograms. The spatial frequency response of the shearing interferometer is well known and for the reader's convenience, it is briefly revisited in a new perspective. It is however less well-known and more interesting to analyze the spatial distribution of the sheared data as well as the spatial topology of the recovered phase produced by some inverse LSI operators. Also we define a useful space of functions S with the property that any sheared data available, along any direction, may be used to recovered a smooth continuous phase with the bonus property of fully covering the pupil of the wavefront being tested. These combined aspects allow us to find the best possible wave-front reconstruction from the available sheared data using one, two or n sheared interferograms.
We propose a technique for ray tracing, based in the propagation of a Gaussian shape invariant under the Fresnel diffraction integral. The technique uses two driving independent terms to direct the ray and is based on the fact that at any arbitrary distance, the center of the propagated Gaussian beam corresponds to the geometrical projection of the center of the incident beam. We present computer simulations as examples of the use of the technique consisting in the calculation of rays through lenses and optical media where the index of refraction varies as a function of position.
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