CdTe thin films of 50 nm thickness have been deposited on glass substrates by thermal vacuum evaporation technique and the γ-irradiation effect on their optical properties has been investigated. Transmittance and reflectance have been measured at normal incidence, in the visible region from 400 to 700 nm, and were used to evaluate the optical parameters and the band gap energy for CdTe thin films before and after γ-irradiation. Structure and surface morphology before and after γirradiation were investigated using X-ray diffraction (XRD) analysis and scanning electron microscope (SEM) respectively. XRD pattern of the as-deposited CdTe film shows an amorphous nature. Crystalline structure was observed to improve when samples were exposed to γ-irradiation at doses from 40-120 kGy in the (111) plane of the cubic zincblende structure. SEM shows a change in the surface morphology of CdTe films as a consequence of γ-irradiation compared to as-deposited sample. The optical properties such as refractive index, extinction coefficient, dielectric constant were found to decrease with the increase of the dose of γ-irradiation. Energy band gap was found to decrease from 2.47 eV for the as-deposited down to 2.20 eV for 120 kGy (blue shift compared to bulk CdTe), that was attributed to the small thin film thickness.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.