Given a financial time series such as S&P 500, or any historical data in stock markets, how can we obtain useful information from recent transaction data to predict the ups and downs at the next moment? Recent work on this issue shows initial evidence that machine learning techniques are capable of identifying (non-linear) dependency in the stock market price sequences. However, due to the high volatility and non-stationary nature of the stock market, forecasting the trend of a financial time series remains a big challenge. In this paper, we introduced a new method to simplify noisy-filled financial temporal series via sequence reconstruction by leveraging motifs (frequent patterns), and then utilize a convolutional neural network to capture spatial structure of time series. The experimental results show the efficiency of our proposed method in feature learning and outperformance with 4%-7% accuracy improvement compared with the traditional signal process methods and frequency trading patterns modeling approach with deep learning in stock trend prediction. INDEX TERMS Trend prediction, convolutional neural network, financial time series, motif extraction.
Software fault localization is notoriously tedious and time-consuming. Developed rapidly, machine learning techniques have been adopted for fault localization by researchers. Most existing approaches use the test coverage information as feature input to the learning model, ignoring the limited ability of the single-dimensional features. The effectiveness of fault localization is not greatly improved. To overcome the limitation, we propose a fault localization approach based on Bidirectional Recurrent Neural Networks (BiRNNs) and multi-dimensional features. Our approach collects suspiciousness-based, text similarity-based and fault-proneness-based features from the traditional fault localization areas and software metrics. To evaluate our approach, the experiments have been studied on the real-fault benchmark Defects4J and seeded fault program NanoXML. The experimental results show that our approach effectively improves fault localization accuracy.
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