This paper proposes and investigates the application of the gradient heat flux sensor (GHFS) for measuring the local heat flux in power electronics. Thanks to its thinness, the sensor can be placed between the semiconductor module and the heat sink. The GHFS has high sensitivity and yields direct measurements without an interruption to the normal power device operation, which makes it attractive for power electronics applications. The development of systems for monitoring thermal loading and methods for online detection of degradation and failure of power electronic devices is a topical and crucial task. However, online condition monitoring (CM) methods, which include heat flux sensors, have received little research attention so far. In the current research, an insulated-gate bipolar transistor (IGBT) module-based test setup with the GHFS implemented on the base plate of one of the IGBTs is introduced. The heat flux experiments and the IGBT power losses obtained by simulations show similar results. The findings give clear evidence that the GHFS can provide an attractive condition monitoring method for the thermal loading of power devices.
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