We positioned semiconducting multiwalled carbon nanotube, using an atomic force microscope, between two gold electrodes at SiO2 surface. Transport measurements exhibit single-electron effects with a charging energy of 24 K. Using the Coulomb staircase model, the capacitances and resistances between the tube and the electrodes can be characterized in detail.
We have developed a scheme to manipulate metallic aerosol particles on silicon dioxide substrates using an atomic force microscope. The method utilizes the noncontact mode both for locating and moving nanoparticles of size 10–100 nm. The main advantage of our technique is the possibility of “seeing” the moving particle in real time. Our method avoids well sticking problems that typically hamper the manipulation in the contact mode.
Scanning probe microscopes (SPMs) and especially the atomic force microscope (AFM) can be used as tools for modifying surface structures on the submicrometre and even nanometre scale. For this purpose an advanced interface has been developed to facilitate these manipulations and greatly increase the number of possible applications. In this paper this interface (the nanoManipulator, developed at the University of North Carolina at Chapel Hill) is implemented on a combined AFM-confocal microscope. This setup allows AFM imaging, manipulations and fluorescence imaging of the same area on the sample.The new setup is tested on ringlike structures of a porphyrin derivative (BP6). A small amount of the fluorescent material could be displaced with the AFM tip. A special tool (sweep mode) allowed a modification of around 130 nm, which was afterwards detectable with the confocal microscope. The resolution attainable in these kind of experiments could go down below 100 nm and is primarily determined by the tip and sample geometry.Comparable with this experiment is the application of a near-field scanning optical microscope (NSOM) to make photochemical modifications. Using the excitation power coming from the NSOM probe the fluorescence can be quenched by bleaching a selected area instead of displacing the material. Application on the BP6 rings led to a modification of 280 nm wide.AFM can perform modifications on a smaller scale but is less selective than NSOM. Optical investigation of the changes after AFM manipulation can give more elaborate information on the modifications. This will extend the possible applications of the techniques and may ultimately go down to the single-molecule level.
Tapping-mode atomic force microscopy imaging under different cantilever vibration amplitudes has been used to differentiate the host beta-cyclodextrin nanotubes from retinal/beta-cyclodextrin inclusion complex nanotubes. It was observed that both compounds were deformed differently by the applied probe force because of their different local rigidity. This change in the elasticity properties can be explained as a consequence of the inclusion process. This method shows that tapping-mode atomic force microscopy is an useful tool to map soft sample elasticity properties and to distinguish inclusion complexes from their host molecules on the basis of their different mechanical response.
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