Deterministic logic BIST (DLBIST) is an attractiveis the application of additional external deterministest strategy, since it combines advantages of tic patterns on top of the pseudo-random test [91. deterministic ex{emal testing and pseudo-random Unfortunately, the very last percentages of fault D I S T . Unfortunately, previously published coverage require the largest amount of determinis-DLBIST methods are unsuited for large ICs, since tic patterns, so the benefits of LBIST are severely computing time 'and memory consumption of the reduced by this approach. DLBIST synthesis algorithms increase exponentiully, or at least;cubically, with the circuit size.More efficient are compression and decompression methods, where a small amount of external testIn this paper, we propose a novel DLBIST data is continuously fed into the circuit [13] [14].synthesis procedure that has nearly linear comHowever, this approach is no longer a BIST plexiry in [ e m s of both computing time and memmethod it requires still external ATE and looses ory consumption. Ihe new algorithms are based some benefits of BIST like in-field testing. An on binary decision diagrams (BDDs). We demonalternative for incieasing the fault coverage is ,strate the ejjiciency of the new algorithms for inserting test points, which has been proposed for industrial designs up to 2M gates.both LBIST and external testing [41[51[151[171. While the area increase due to test points may be
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