High performance solution-processed infrared photodiodes ITO/ZnO/PbSxSe1−x/Au, in which ternary PbSxSe1−x colloidal quantum dots acts as the active layer and ZnO interlayer acts as electron-transporting layer, have been demonstrated.

We demonstrate, to the best of our knowledge, a first accurate empirical model for reflectance measurements from highly turbid media over the full range of incident angles, i.e., for reflectivity values going from unity in the total internal reflection regime to nearly zero when almost all the light is transmitted. Evidence that our model is accurate is provided by extraction of the particle size, followed by independent verification with dynamic light scattering. Our methodology is in direct contrast with the prevalent approach in turbid media of focusing on only the critical angle region, which is just a small subset of the entire reflectance data.

Abstract. A first accurate measurement of the complex refractive index in an intralipid emulsion is demonstrated, and thereby the average scatterer particle size using standard Mie scattering calculations is extracted. Our method is based on measurement and modeling of the reflectance of a divergent laser beam from the sample surface. In the absence of any definitive reference data for the complex refractive index or particle size in highly turbid intralipid emulsions, we base our claim of accuracy on the fact that our work offers several critically important advantages over previously reported attempts. First, our measurements are in situ in the sense that they do not require any sample dilution, thus eliminating dilution errors. Second, our theoretical model does not employ any fitting parameters other than the two quantities we seek to determine, i.e., the real and imaginary parts of the refractive index, thus eliminating ambiguities arising from multiple extraneous fitting parameters. Third, we fit the entire reflectanceversus-incident-angle data curve instead of focusing on only the critical angle region, which is just a small subset of the data. Finally, despite our use of highly scattering opaque samples, our experiment uniquely satisfies a key assumption behind the Mie scattering formalism, namely, no multiple scattering occurs. Further proof of our method's validity is given by the fact that our measured particle size finds good agreement with the value obtained by dynamic light scattering. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

A widely used method for determining refractive index postulates that the derivative of the angular profile for light reflected from the sample is maximum at the critical angle for total internal reflection (TIR). It is well-known that in turbid media this "differentiation method" yields errors in refractive index. Unexplained anomalies in previous error-calculations are eliminated if one uses a recent model of TIR which departs from traditional Fresnel theory. However we find that, in practical situations, the refractive index obtained by differentiation even after error-correction is significantly different from the best estimate for the refractive index obtained by curve-fitting the reflectance data. Thus the differentiation method lacks scientific validity in turbid media.

We present an aluminum (Al) laminated nanostructure stacked on a glass substrate to produce highly transmitted narrowband ultraviolet (UV) filters. The laminated nanostructure was mainly composed of an Al nanohole array, and each Al nanohole had a coaxial Al nanoring at the bottom. This UV filter showed a single dominant peak with a high transmission over 50% and a narrow bandwidth less than 80 nm in the 200–400 nm waveband that was achieved based on the synergy of surface plasmon resonance (SPR) and localized surface plasmon resonance (LSPR). The electric field profiles of the laminated nanostructure indicate that SPR selects the transmission wavelength and LSPR contributes to single peak. This narrowband UV filter can be utilized in UV detectors.

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