Gas-MacEtch of Si with a Pt catalyst allows vertical etching nanostructures with an extreme aspect ratio up to 10 000 : 1.

Hard X-ray dark-field and phase contrast imaging using grating interferometry have shown great potential for medical and industrial applications. However, the wide spread applicability of the method is challenged by a number of technical related issues such as relatively low dose and flux efficiency due to the absorption grating, fabrication of high quality absorption gratings, slow data acquisition protocol and high mechanical stability requirements. In this paper, the authors propose an interferometric method for dark-field and differential phase contrast imaging based on phase shifting elements only with the purpose to improve the dose and flux efficiency and simplify the setup. The proposed interferometer consists of two identical phase gratings of small pitch (1.3 μm), which generate an interference fringe at the detector plane with a large enough pitch that can be resolved directly. In particular, the system exhibits flexible and tunable dark-field sensitivity which is advantageous to probe unresolvable micro-structure in the sample. Experiments on a micro focal tube validated the method and demonstrated the versatility and tunability of the system compared to conventional Talbot grating interferometer.

Self-assembly Au nanostructures stabilize the catalyst during metal assisted chemical etching, improving the vertical profile of high aspect ratio Si dense micro-patterns on large area, such as diffraction gratings for X-ray phase contrast imaging.

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MÖ NCH is a 25 mm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 mm. In this work, the characterization results of one of the MÖ NCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G 2 are shown and discussed. Perspectives for the future developments of the MÖ NCH detector are also presented.

Neutron imaging and scattering give data of significantly different nature and traditional methods leave a gap of accessible structure sizes at around 10 micrometers. Only in recent years overlap in the probed size ranges could be achieved by independent application of high resolution scattering and imaging methods, however without providing full structural information when microstructures vary on a macroscopic scale. In this study we show how quantitative neutron dark-field imaging with a novel experimental approach provides both sub-pixel resolution with respect to microscopic correlation lengths and imaging of macroscopic variations of the microstructure. Thus it provides combined information on multiple length scales. A dispersion of micrometer sized polystyrene colloids was chosen as a model system to study gravity induced crystallisation of microspheres on a macro scale, including the identification of ordered as well as unordered phases. Our results pave the way to study heterogeneous systems locally in a previously impossible manner.

Insights into the micro- and nano-architecture of materials is crucial for understanding and predicting their macroscopic behaviour. In particular, for emerging applications such as meta-materials, the micrometer scale becomes highly relevant. The micro-architecture of such materials can be tailored to exhibit specific mechanical, optical or electromagnetic behaviours. Consequently, quality control at micrometer scale must be guaranteed over extended areas. Mesoscale investigations over millimetre sized areas can be performed by scanning small angle X-ray scattering methods (SAXS). However, due to their long measurement times, real time or operando investigations are hindered. Here we present a method based on X-ray diffractive optics that enables the acquisition of SAXS signals in a single shot (few milliseconds) over extended areas. This method is applicable to a wide range of X-ray sources with varying levels of spatial coherence and monochromaticity, as demonstrated from the experimental results. This enables a scalable solution of spatially resolved SAXS.

Metal microstructured optical elements for grating-based X-ray phase-contrast interferometry were fabricated by using an innovative approach of microcasting: hot embossing technology with low melting temperature (280°C) metal alloy foils and silicon etched templates. A gold-tin alloy (80w%Au / 20w%Sn) was used to cast micro-gratings with pitch sizes in the range of 2 to20 µm and depth of the structures up to 80 µm. The metal filling of the silicon template strongly depends on the wetting properties of the liquid metal on the groove surface. A thin metal wetting layer (20 nm of Ir or Au) was deposited before the casting in order to turn the template surface into hydrophilic with respect of the melted metal alloy. Temperature and pressure of the hot embossing process were optimized for a complete filling of the cavities in a low viscosity regime of the liquid metal, and for minimizing the shear force that might damage the silicon structures for small pitch grating. The new method has relevant advantages, such as being a low cost technique, fast and easily scalable to large area fabrication.