A method, a material system, and the physics for tailoring artificial magnetic field landscapes on micron and submicron length scales over a topographically flat surface in remanence are presented. KeV-He+ ion bombardment induced magnetic patterning was used for the creation of in-plane magnetized domains in Exchange Bias layer systems. This technology sets defined magnetic domain wall charges between the in-plane magnetic domains by individually set domain properties (magnitude and direction of anisotropy parameters) on both sides of the domain wall. The magnetic surface charge distribution was analyzed by magnetic force microscopy and compared to micromagnetic simulations.

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We explore tomographic mask-based Fourier transform x-ray holography with respect to the use of a thin slit as a reference wave source. This imaging technique exclusively uses the interference between the waves scattered by the object and the slit simplifying the experimental realization and ensuring high data quality. Furthermore, we introduce a second reference slit to rotate the sample around a second axis and to record a dual-axes tomogram. Compared to a single-axis tomogram, the reconstruction artifacts are decreased in accordance with the reduced missing data wedge. Two demonstration experiments are performed where test structures are imaged with a lateral resolution below 100 nm.