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The usefulness of Kikuchi line diffraction patterns for electron microscopy experiments is demonstrated. Examples are given of the determination of exact foil orientation, the calibration of tilting stages, and the determination of the magnitude of the deviation parameter s from the exact Bragg condition.

The crystal structure of the needle‐shaped metastable β″ phase in an AlSiMg alloy has been studied by electron diffraction. Three different matrix orientations, [001], [101], and [112] were obtained using a tilt‐rotation goniometer stage and checked with a computed stereographic projection. The β″‐phase structure has been found to be monoclinic (a = c = 6.16 Å, b = 7.1 Å, β = 82°) in excellent confirmation to Schegoleva's X‐ray analysis [6].

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