In this paper, a new technique for localization of fault detection and diagnosis in the interconnects and logic blocks of an arbitrary design implemented on a Field-Programmable Gate Array (FPGA) using BIST is presented. This technique can uniquely identify any single bridging, open or stuck-at fault in the interconnect as well as any single functional fault, a fault resulting a change in the truth table of a function, in the logic blocks. The test pattern generator and output response analyzer are configured by existing CLBs in FPGAs; thus, no extra area overhead is needed for the proposed BIST structure. The scheme also rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of timing defects. Experimental results confirm high diagnostic accuracy of the proposed scheme and its time efficiency.
Cryptography plays an important role in the security of data transmission. The Advanced Encryption Standard (AES) is the newly accepted symmetric cryptography standard for transferring block of data securely. However, the faults that accidently or maliciously occur in the hardware implementation of this standard may cause erroneous encrypted/decrypted output that results in losing the original message and/or leaking the secret key information. In this paper, concurrent structure independent fault detection schemes for designing high performance and reliable architecture of the AES is presented. For high performance applications, instead of using look-up tables alone for the implementation of S-box and inverse S-box and their parity predictions, logic gate implementations based on composite fields are also utilized. For the reliability, operation are performed independent of the method the S-box is implemented. The proposed schemes can be applied to both the LUT and composite field implementations. Moreover, the overhead costs, including space complexity and time delay of the proposed schemes are analyzed and compared with their counterparts. Finally, our simulation results show the error coverage of greater than 99 percent for the proposed schemes.
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