No abstract

No abstract

In TEM, the first direct electron detectors for recording images were developed primarily to collect data for cryo electron microscopy (cryo EM), in order to increase the detection quantum efficiency by collecting data from individual electrons rather than integrating the dose of many electrons per pixel (Li, et al., 2013). Fast detectors with somewhat lower number of pixels and very high frame rates were developed for pixelated scanning TEM (pixelated STEM) (Simson, et al., 2015) (Tate, et al., 2016), where a full electron diffraction pattern is recorded for each position of a STEM scan. It has long been known that collections of electron diffraction patterns, in particular from overlapping sample regions, contain a wealth of information about the sample (

No abstract

No abstract

No abstract

No abstract