Based on two different experiments and an optical field calculation, we show that the free-carrier absorption αfc in Zn(Cd)Se/ZnMgSSe semiconductor lasers is about 4 cm−1 and that it is smaller than that of GaAs/AlGaAs semiconductor lasers. We have measured the dependence of the L-I characteristics on the cavity length of double heterostructure (DH) lasers under photopumped operation and of single quantum well-separate confinement heterostructure (SQW-SCH) lasers under current-injected operation. For the DH laser, the total absorption coefficient αi and β×J0 product (β is a gain constant, and J0 is the nominal current density that makes the gain equal to zero) are estimated to be 4.2 cm−1 and 8.6×10 cm−1, respectively. For the SQW-SCH laser, αi, β, and J0 are estimated to be 21 cm−1, 4.23×10−3 cm×μm/A, and 1.9×10−3 A/(cm2×μm), respectively. By calculating the optical fields of these lasers, we have estimated that the absorption in a GaAs substrate is 16.53 cm−1 in the SQW-SCH laser and that it is negligible in the DH laser. We have shown that the large loss in the SQW-SCH laser is caused by both αfc and the absorption in the substrate and that αi in the DH laser is caused only by free carrier absorption.
We have carried out structural studies of nonluminescent areas developed by current injection in ZnMgSSe alloy-based II–VI blue light emitting diodes by electroluminescence topography and transmission electron microscopy. The nonradiative regions, which spread out in the 〈100〉 direction during current injection, consist of a high density of dislocation dipoles and dislocation loops. The source of these defects is the preexisting stacking faults originating at the substrate/epilayer interface. The dipoles themselves are aligned along both of the 〈110〉 directions lying in the {111} plane. Their Burgers vectors were of the type (a/2)〈011〉 inclined at 45° to the (001) junction plane.
We have experimentally investigated refractive indices n of ZnxMg1−xSySe1−y, using the ellipsometry method and reflection-spectrum measurement. The samples are epitaxial films of undoped ZnxMg1−xSySe1−y grown by molecular beam epitaxy on semi-insulating GaAs substrates. The obtained dispersion relations of n in the transparent region are classified by the band-gap energy Eg. We have found that the refractive index n of ZnxMg1−xSySe1−y decreases as Eg increases. These results will be available for the design of blue laser diodes containing ZnMgSSe.
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