We detect electroluminescence in single layer molybdenum disulphide (MoS2) field-effect transistors built on transparent glass substrates. By comparing absorption, photoluminescence, and electroluminescence of the same MoS2 layer, we find that they all involve the same excited state at 1.8eV. The electroluminescence has pronounced threshold behavior and is localized at the contacts. The results show that single layer MoS2, a direct band gap semiconductor, is promising for novel optoelectronic devices, such as 2-dimensional light detectors and emitters. Here, we report electrically excited luminescence in 1L-MoS 2 FETs, and study the underlying emission mechanism. We find that the electroluminescence occurs via hot carriers and is localized in the contacts region. The observed photoluminescence and electroluminescence arise from the same excited state at 1.8eV. Molybdenum disulphide (MoS1L-MoS 2 crystals are produced by micromechanical cleavage of bulk MoS 2 (Structure Probe Inc.-SPI, Natural Molybdenite) on 100nm SiO 2 . As for the case of graphene [20], interference allows visibility and counting the number of layers, Fig.1a. Due to the different dielectric properties, an optimum thickness of 100nm SiO 2 is well suited for MoS 2 [21]. The presence of monolayers is then confirmed by performing PL measurements, Fig.1b. The PL spectrum of 1L-MoS 2 exhibits two bands at 2eV and 1.8eV (Fig.1b) associated with excitonic transitions at the K point of the Brillouin zone[4]. The energy difference of 0.2eV has been attributed to the degeneracy breaking of the valence band due to spin-orbit coupling [4,7,8,22]. As compared to bulk MoS 2 , Fig.1b, 1L-MoS 2 does not have a peak at 1.4eV [3,4], associated with the indirect band gap [12]. In addition 1L-MoS 2 exhibits a stronger PL intensity compared to bulk MoS 2 [3, 4] due to the direct band gap. Another evidence for 1L-MoS 2 comes from the analysis of the Raman spectrum, Fig.1d. The peak at∼385cm −1 corresponds to the in plane (E 1 2g ) mode [23], while that at ∼404 cm −1 is attributed to the out of plane (A 1g ) mode [23]. The E 1 2g mode softens and A 1g mode stiffens with increasing layer thickness[23], similar to what happens for other layered materials, where the bond distance changes with number of layers [24]. The frequency difference between these two modes can be used as a signature of 1L-MoS 2 [23].1L-MoS 2 flakes are then transferred onto glass substrates by using a poly(methyl methacrylate) (PMMA) based transfer technique, similar to that previously used to transfer graphene onto optical fibre cores [25]. This process involves spin coating two layers of 495K PMMA and one layer of 950K PMMA on the substrate where flakes are deposited. The samples are subsequently immersed in de-ionized (DI) water at 90 • C for 1h, resulting in the detachment of the polymer film, due to the intercalation of water at the polymer-SiO 2 interface. MoS 2 flakes stick to the PMMA, and can thus be removed from the original substrate and mechanically transferred onto glass substrates [2...

Black phosphorus is a layered semiconductor that is intensely researched in viewof applications in optoelectronics. In this Letter, we investigate a multi-layer black phosphorus photo-detector that is capable of acquiring high-contrast (V>0.9) images both in the visible (λ VIS =532nm) as well as in the infrared (λ IR =1550nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain.In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with sub-micron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.

Thin film transistors (TFTs) are now poised to revolutionize the display, sensor, and flexible electronics markets. However, there is a limited choice of channel materials compatible with low-temperature processing. This has inhibited the fabrication of high electrical performance TFTs. Single-walled carbon nanotubes (CNTs) have very high mobilities and can be solution-processed, making thin film CNT-based TFTs a natural direction for exploration. The two main challenges facing CNT-TFTs are the difficulty of placing and aligning CNTs over large areas and low on/off current ratios due to admixture of metallic nanotubes. Here, we report the self-assembly and self-alignment of CNTs from solution into micron-wide strips that form regular arrays of dense and highly aligned CNT films covering the entire chip, which is ideally suitable for device fabrication. The films are formed from pre-separated, 99% purely semiconducting CNTs and, as a result, the CNT-TFTs exhibit simultaneously high drive currents and large on/off current ratios. Moreover, they deliver strong photocurrents and are also both photo- and electroluminescent.

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We measure the temperature distribution in a biased single-layer graphene transistor using Raman scattering microscopy of the 2D-phonon band. Peak operating temperatures of 1050 K are reached in the middle of the graphene sheet at 210 KW cm -2 of dissipated electric power. The metallic contacts act as heat sinks, but not in a dominant fashion. To explain the observed temperature profile and heating rate, we have to include heat-flow from the graphene to the gate oxide underneath, especially at elevated temperatures, where the graphene thermal conductivity is lowered due to umklapp scattering. Velocity saturation due to phonons with about 50 meV energy is inferred from the measured charge density via shifts in the Raman G-phonon band, suggesting that remote scattering (through field coupling) by substrate polar surface phonons increases the energy transfer to the substrate and at the same time limits the high-bias electronic conduction of graphene.

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Graphene has extraordinary electronic and optical properties and holds great promise for applications in photonics and optoelectronics. Demonstrations including high-speed photodetectors, optical modulators, plasmonic devices, and ultrafast lasers have now been reported. More advanced device concepts would involve photonic elements such as cavities to control light–matter interaction in graphene. Here we report the first monolithic integration of a graphene transistor and a planar, optical microcavity. We find that the microcavity-induced optical confinement controls the efficiency and spectral selection of photocurrent generation in the integrated graphene device. A twenty-fold enhancement of photocurrent is demonstrated. The optical cavity also determines the spectral properties of the electrically excited thermal radiation of graphene. Most interestingly, we find that the cavity confinement modifies the electrical transport characteristics of the integrated graphene transistor. Our experimental approach opens up a route towards cavity-quantum electrodynamics on the nanometre scale with graphene as a current-carrying intra-cavity medium of atomic thickness.

The high carrier mobility and thermal conductivity of graphene make it a candidate material for future high-speed electronic devices. Although the thermal behaviour of high-speed devices can limit their performance, the thermal properties of graphene devices remain incompletely understood. Here, we show that spatially resolved thermal radiation from biased graphene transistors can be used to extract the temperature distribution, carrier densities and spatial location of the Dirac point in the graphene channel. The graphene exhibits a temperature maximum with a location that can be controlled by the gate voltage. Stationary hot spots are also observed. Infrared emission represents a convenient and non-invasive characterization tool for graphene devices.