Articles you may be interested inCrystallization of Pb(Zr,Ti)O3 films prepared by radio frequency magnetron sputtering with a stoichiometric oxide target J. Vac. Sci. Technol. A 13, 2214 (1995); 10.1116/1.579545 Effects of surface structures of MgO(100) single crystal substrates on ferroelectric PbTiO3 thin films grown by radio frequency sputtering J. Vac. Sci. Technol. A 13, 95 (1995); 10.1116/1.579392Raman scattering study of lead zirconate titanate thin films prepared on silicon substrates by radio frequency magnetron sputtering
Generalized Snell-Descartes and Fresnel laws are derived for harmonic inhomogeneous plane waves that are incident upon a static interface between two continuous absorbing dielectric media that are macroscopically characterized by their electric and magnetic permittivities and their conductivities. A coordinate-free formalism based on complex vector algebra is used to carry out all discussions. Surprisingly, the usual complex Snell-Descartes laws for reflection and refraction and Fresnel laws for polarization are recovered only in the special case in which the vector characterizing the direction of inhomogeneity is in the plane of incidence. In the more general case a new deflection angle between planes of incidence and refraction has to be introduced. An experiment is proposed to test this prediction. A generalized form of the TE and TM modes (with respect to the interface), which are elliptically polarized and which are called parallel electric and parallel magnetic modes, also emerges.
Raman scattering is used to characterize thin films of PbTi1−xZrxO3. The films have been prepared on platinum-coated (100) silicon by radio-frequency (rf)-magnetron sputtering without substrate heating followed by a post-deposition annealing at 600–650 °C. As the concentration of Zr is increased, the Raman peaks broaden and their intensities decrease more rapidly compared with bulk ceramic or powder samples, while the background intensity increases. The observations show that the crystal structure of the films is locally deformed and significantly disordered. With increasing x, the soft E(TO) mode shifts to lower frequencies. An additional Raman peak appears besides the phonon peaks expected in a perfect crystal. The soft mode strongly couples with the extra mode, similarly with the case of ceramic samples. The results are related to features of the thin films such as a frustrated phase transition, i.e., smaller differences between the lattice parameters a and c in comparison with powder data, and an electrical behavior showing a diffuse ferroelectric-to-paraelectric transition with a broad peak.
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