This paper describes an evaluation of the use of a scanning electron microscope to perform a rapid total analysis under secondary electron image conditions using a commercial energy dispersive X‐ray analyser. Problems encountered with overlapping intensity peaks and interference by the solid state Si (Li) detector are discussed. Elements heavier than sodium are detectable in metallic and geological samples and the total analysis of oxides requires only pure elements as standards.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.