A number of backside analysis techniques rely on the successful use of optical beams in performing backside fault isolation. In this paper, the authors have investigated the influence of the 1340 nm and 1064 nm laser wavelength on advanced CMOS transistor performance.
The Effect of Magnetic Field 19 3. 3. 3 Current Magnitu.e and Waveshape 3. 3. 4 Pressure Surges iii TABLE OF CONTENTS (Continued) Section Page 4 ANALYSIS AND DISCUSSION 25 9 Estimates of Effects by Yates' Algorithm for Conditioned Gaps with ("yes") and Without ("no") Magnetic Field 28 ix PURPOSE The factors ir/.uencing breakdown in high voltage vacuum devices will be ctudied. The information obtained will provide the basis for improvement in the design of microwave and mocmlator tubes that must operate at voltages greater than 100 kilovolts without breakdown.
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