Spatial-domain Green's functions for multilayer, planar geometries are cast into closed forms with two-level approximation of the spectral-domain representation of the Green's functions. This approach is very robust and much faster compared to the original one-level approximation. Moreover, il does not require the investigation of the spectral-domain behavior of the Green's functions in advance to decide on the parameters of the approximation technique, and it can be applied to any component of the dyadic Green's function with the same ease.
The derivation of the closed-form spatial domain Green's functions for the vector and scalar potentials is presented for a microstrip geometry with a substrate and a superstrate, whose thicknesses can be arbitrary. The spatial domain Green's functions for printed circuits are typically expressed as Sommerfeld integrals, that are inverse Hankel transform of the corresponding spectral domain Green's functions, and are quite time-consuming to evaluate. Closed-form representations of these Green's functions in the spatial domains can only be obtained if the integrands are approximated by a linear combination of functions that are analytically integrable. In this paper, we show we can accomplish this by approximating the spectral domain Green's functions in terms of complex expo-nential~ by using the least square Prony's method.
The closed-form Green's functions of the vector and scalar potentials in the spatial domain are presented for the sources of horizontal electric, magnetic, and vertical electric, magnetic dipoles embedded in general, multilayer, planar media. First, the spectral domain Green's functions in an arbitrary layer are derived analytically from the Green's functions in the source layer by using a recursive algorithm. Then, the spatial domain Green's functions are obtained by adding the contributions of the direct terms, surface waves, and complex images approximated by the Generalized Pencil of Functions Method (GPOF). In the derivations, the main emphasis is to put these closed-form representations in a suitable form for the solution of the mixed potential integral equation (MPIE) by the method of moments in a general three-dimensional geometry. The contributions of this paper are: 1) providing the complete set of closed-form Green's functions in spectral and spatial domains for general stratified media; 2) using the GPOF method, which is more robust and less noise sensitive, in the derivation of the closed-form spatial domain Green's functions; and 3) casting the closed-form Green's functions in a form to provide efficient applications of the method of moments. Z=Z ,-h region-(i+l) region-(I) z=d i-h z=-h (HED,VED,HMD,VMD) region-(i-l) z=-d i-1-h region-(i-m)
An efficient and rigorous method for the analysis of planarly layered geometries with vertical metallizations is presented. The method is based on the use of the closed-form spatial-domain Green's functions in conjunction with the method of moments (MoM). It has already been demonstrated that the introduction of the closed-form Green's functions into the MoM formulation results in significant computational improvement for the analysis of planar geometries. However, in cases of vertical metallizations, such as shorting pin's, via holes, etc., there are some difficulties in incorporating the closed-form Green's functions into the MoM formulation. In this paper, these difficulties are discussed and their remedies are proposed. The proposed approach is compared to traditional approaches from a theoretical point of view, and the numerical implementation is demonstrated through some examples. The results are also compared to those obtained from the commercial software em by SONNET. Index Terms-Closed-form Green's functions, generalized pencil of function method, method of moments, planarly layered media.
Spontaneous emission of fluorophores located close to a reflecting surface is modified by the interference between direct and reflected waves. The spectral patterns of fluorescent emission near reflecting surfaces can be precisely described with a classical model that considers the relative intensity and polarization state of direct and reflected waves depending on dipole orientation. An algorithm based on the emission model and polynomial fitting built into a software application can be used for fast and efficient analysis of self-interference spectra, yielding information about the location of the emitters with subnanometer precision. Spectral information was used to study thin films of fluorescent substances on surfaces.
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