-In this paper artificial neural networks (ANN) are applied to modeling of electronic circuits. ANNs are used for application of the black-box modeling concept in the time domain. Modeling process is described, so the topology of the ANN, the testing signal used for excitation, together with the complexity of ANN are considered. The procedure is first exemplified in modeling of resistive circuits. MOS transistor, as a four-terminal device, is modeled. Then nonlinear negative resistive characteristic is modeled in order to be used as a piece-wise linear resistor in Chua's circuit. Examples of modeling nonlinear dynamic circuits are given encompassing a variety of modeling problems. A nonlinear circuit containing quartz oscillator is considered for modeling. Verification of the concept is performed by verifying the ability of the model to generalize i.e. to create acceptable responses to excitations not used during training. Implementation of these models within a behavioural simulator is exemplified. Every model is implemented in realistic surrounding in order to show its interaction, and of course, its usage and purpose.
Artificial neural networks are applied for modeling the input and output circuits of the digital part of the digital–analog and analog–digital interface, respectively, in CMOS mixed-mode circuits. The generalization property of the neural networks is exploited to apply the models in a set of previously unknown situations, the most important being loading the model generated from the unloaded circuit. The models developed are applicable in mixed-signal behavioral simulations.
Abstract-The design of Micro-Electrical-Mechanical Systems requires that the entire system can be modelled and simulated. Additionally, behaviour under fault conditions must be simulated to determine test and diagnosis strategies. While the electrical parts of a system can be modelled at transistor, gate or behavioural levels, the mechanical parts are conventionally modelled in terms of partial differential equations (PDEs). Mixed-signal electrical simulations are possible, using e.g. VHDL-AMS, but simulations that include PDEs are prohibitively expensive. Here, we show that complex PDEs can be replaced by black-box functional models and, importantly, such models can be characterized automatically and rapidly using artificial neural networks (ANNs). We demonstrate a significant increase in simulation speed and show that test and diagnosis strategies can be derived using such models.
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