The index surface of the normal component of variation of the inverse tensor dielectric constant of the photorefractive Bi12TiO20 crystal of 23 symmetry class is constructed and analyzed. The extremal values of the index surface of the normal component for Bi12TiO20 crystal with formed holographic grating are determined. It is shown that the combined action of the photoelastic and inverse piezoelectric effects leads to a change in the maximum and minimum values of the normal component of variation of the inverse tensor dielectric constant of the crystal with the wave vector of the holographic grating oriented along the crystallographic direction.
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