Single-phase multiferroic materials are of considerable interest for future memory and sensing applications. Thin films of Aurivillius phase Bi7Ti3Fe3O21 and Bi6Ti2.8Fe1.52Mn0.68O18 (possessing six and five perovskite units per half-cell, respectively) have been prepared by chemical solution deposition on c-plane sapphire. Superconducting quantum interference device magnetometry reveal Bi7Ti3Fe3O21 to be antiferromagnetic (TN = 190 K) and weakly ferromagnetic below 35 K, however, Bi6Ti2.8Fe1.52Mn0.68O18 gives a distinct room-temperature in-plane ferromagnetic signature (Ms = 0.74 emu/g, μ0Hc =7 mT). Microstructural analysis, coupled with the use of a statistical analysis of the data, allows us to conclude that ferromagnetism does not originate from second phase inclusions, with a confidence level of 99.5%. Piezoresponse force microscopy (PFM) demonstrates room-temperature ferroelectricity in both films, whereas PFM observations on Bi6Ti2.8Fe1.52Mn0.68O18 show Aurivillius grains undergo ferroelectric domain polarization switching induced by an applied magnetic field. Here, we show for the first time that Bi6Ti2.8Fe1.52Mn0.68O18 thin films are both ferroelectric and ferromagnetic and, demonstrate magnetic field-induced switching of ferroelectric polarization in individual Aurivillius phase grains at room temperature
The development of a CMOS compatible flexible piezoelectric material is desired for numerous applications and in particular for biomedical MEMS devices. Aluminum nitride (AlN) is the most commonly used CMOS compatible piezoelectric material, which is typically deposited on Si in order to enhance the c-axis (002) crystal orientation which gives AlN its high piezoelectric properties. This paper reports on the successful deposition of AlN on polyimide (PI-2611) material. The AlN deposited has a FWHM (002) value of 5.1 • and a piezoelectric d 33 value of 1.12 pm V −1 , and SEM images show high quality columnar grains. The highly crystalline AlN material is due to the semi-crystalline properties of the polyimide film used. Cytotoxicity testing showed the AlN/polyimide material to be non-toxic to 3T3 cells and primary neurons. Surface properties of the AlN/polyimide film were evaluated as they have a significant effect on the adhesion of cells to the film. The results show neurons adhering to the AlN surface. The results of this paper show the characterization of a new flexible-CMOS and biocompatible AlN/polyimide material for MEMS devices with improved crystallinity and piezoelectric properties.
We report the first observation of piezoelectricity and ferroelectricity in individual Sb(2)S(3) nanowires embedded in anodic alumina templates. Switching spectroscopy-piezoresponse force microscopy (SS-PFM) measurements demonstrate that individual, c-axis-oriented Sb(2)S(3) nanowires exhibit ferroelectric as well as piezoelectric switching behavior. Sb(2)S(3) nanowires with nominal diameters of 200 and 100 nm showed d(33(eff)) values around 2 pm V(-1), while the piezo coefficient obtained for 50 nm diameter nanowires was relatively low at around 0.8 pm V(-1). A spontaneous polarization (P(s)) of approximately 1.8 μC cm(-2) was observed in the 200 and 100 nm Sb(2)S(3) nanowires, which is a 100% enhancement when compared to bulk Sb(2)S(3) and is probably due to the defect-free, single-crystalline nature of the nanowires synthesized. The 180° ferroelectric monodomains observed in Sb(2)S(3) nanowires were due to uniform polarization alignment along the polar c-axis.
Multiferroic materials displaying coupled ferroelectric and ferromagnetic order parameters could provide a means for data storage whereby bits could be written electrically and read magnetically, or vice versa. Thin films of Aurivillius phase Bi6Ti2.8Fe1.52Mn0.68O18, previously prepared by a chemical solution deposition (CSD) technique, are multiferroics demonstrating magnetoelectric coupling at room temperature. Here we demonstrate the growth of a similar composition, Bi6Ti2.99Fe1.46Mn0.55O18, via the liquid injection chemical vapor deposition technique. High resolution magnetic measurements reveal a considerably higher in-plane ferromagnetic signature than CSD grown films (MS = 24.25 emu/g (215 emu/cm 3 ), MR = 9.916 emu/g (81.5 emu/cm 3 ), HC = 170 Oe). A statistical analysis of the results from a thorough microstructural examination of the samples, allows us to conclude that the ferromagnetic signature can be attributed to the Aurivillius phase, with a confidence level of 99.95 %. In addition, we report the direct piezoresponse force i E-mail: lynette.keeney@tyndall.ieJournal of the American Ceramic Society DOI: 10.1111DOI: 10. /jace.14597 (2016 2 microscopy (PFM) visualization of ferroelectric switching while going through a full in-plane magnetic field cycle, where increased volumes (8.6 to 14 % compared with 4 to 7 % for the CSDgrown films) of the film engage in magnetoelectric coupling and demonstrate both irreversible and reversible magnetoelectric domain switching. IntroductionMultiferroic materials which exhibit more than one mutually-coupled ferroic (e.g. ferroelectric (FE) / ferromagnetic (FM) / ferroelastic) order parameter (OP) in a single phase, provide additional degrees of OP freedom that can be exploited in novel multistate memory and sensing devices.Magnetoelectricity (the generation of a change in magnetization by an applied electric field or vice versa), on the other hand, is a related phenomenon that will arise in any material that is both electrically and magnetically polarizable and possesses an appropriate magnetic symmetry, regardless of whether it is multiferroic or not. For example, the magnetoelectric Cr2O3 is an antiferromagnetic dielectric and is neither FE nor FM 1 . The unique advantage of single phase magnetoelectric multiferroics is that not only could they find application in high storage density, lowpower memory devices that can be electrically written and magnetically read, but also memory technologies with 4-state logic might be achieved by constructing devices that exploit the presence of both ferroelectric and ferromagnetic states 2 -representing a clear improvement over current 2-state logic devices. However, there are relatively few 3-8 materials demonstrating ferroelectric and ferromagnetic properties in a single-phase at room temperature. Due to conflicting electronic structure requirements for ferroelectricity (empty d orbitals) and ferromagnetism (partially filled d orbitals), the two properties tend to be mutually exclusive 9 . Examples of multiferroic material...
The five-layer Aurivillius phase Bi6TixFeyMnzO18 system is a rare example of a single-phase room temperature multiferroic material. To optimise its properties and exploit it for future memory storage applications, it is necessary to understand the origin of the room temperature magnetisation. In this work we use high resolution scanning transmission electron microscopy, EDX and EELS to discover how closely-packed Ti/Mn/Fe cations of similar atomic number are arranged, both within the perfect structure and within defect regions. Direct evidence for partitioning of the magnetic cations (Mn and Fe) to the central three of the five perovskite (PK) layers is presented, which reveals a marked preference for Mn to partition to the central layer. We infer this is most probably due to elastic strain energy considerations. The observed increase (>8%) in magnetic cation content at the central PK layers engenders up to a 90% increase in potential ferromagnetic spin alignments in the central layer and this could be significant in terms of creating pathways to the long-range room temperature magnetic order observed in this distinct and intriguing material system.
Access to the full text of the published version may require a subscription. À5 emu. The BTF7C3O films were scrutinized by xray diffraction, high resolution transmission electron microscopy, scanning transmission electron microscopy, and energy dispersive x-ray analysis mapping to assess the prospect of the observed multiferroic properties being intrinsic to the main phase. The results of extensive micro-structural phase analysis demonstrated that the BTF7C3O films comprised of a 3.95% Fe/Co-rich spinel phase, likely CoFe 2 À x Ti x O 4 , which would account for the observed magnetic moment in the films. Additionally, x-ray magnetic circular dichroism photoemission electron microscopy (XMCD-PEEM) imaging confirmed that the majority of magnetic response arises from the Fe sites of Fe/Co-rich spinel phase inclusions. While the magnetic contribution from the main phase could not be determined by the XMCD-PEEM images, these data however imply that the Rights
This paper reports the first-ever presentation of evidence for room-temperature ferroelectric behavior in anatase-phase titanium dioxide (a-TiO2). It is shown that behaviour strongly indicative of ferroelectric behavior is induced in ultra-thin (20nm to 80nm) biaxially-strained epitaxial films of a-TiO2 deposited by liquid injection chemical vapour deposition onto (110) Submitted to neodymium gallium oxide (NGO) substrates. The structural properties of the films were analyzed by x-ray diffraction and high-resolution transmission electron microscopy, which showed significant orthorhombic strain in films. Possible ferroelectric behavior was probed by piezoresponse force microscopy (PFM). The films on NGO showed a switchable dielectric spontaneous polarization, the ability to retain polarization information written into the film using the PFM tip for extended periods (several hours) and at elevated temperatures (up to 100°C) without significant loss, and the disappearance of the polarization at a temperature between 180 and 200°C, indicative of a Curie temperature within this range. This combination of effects is believed to constitute strong experimental evidence for ferroelectric behavior, which has not hitherto been reported in a-TiO2 and opens up the possibility for a range of new devices and materials applications. A model is presented for the effects of large in-plane strains on the crystal structure of anatase which provides a possible explanation for the experimental observations.
The deposition by atomic vapor deposition of highly c-axis-oriented Aurivillius phase Bi 5Ti 3FeO 15 (BTFO) thin films on (100) Si substrates is reported. Partially crystallized BTFO films with c-axis perpendicular to the substrate surface were first deposited at 610°C (8 excess Bi), and subsequently annealed at 820°C to get stoichiometric composition. After annealing, the films were highly c-axis-oriented, showing only (00l) peaks in x-ray diffraction (XRD), up to (0024). Transmission electron microscopy (TEM) confirms the BTFO film has a clear layered structure, and the bismuth oxide layer interleaves the four-block pseudoperovskite layer, indicating the n 4 Aurivillius phase structure. Piezoresponse force microscopy measurements indicate strong in-plane piezoelectric response, consistent with the c-axis layered structure, shown by XRD and TEM
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