No abstract

Structure and magnetic properties of L1 1 CoPtCu thin films sputter-deposited on glass substrates were studied. Perpendicular coercivity (H c\ ) was largely enhanced by the replacement of Co with Cu with x ¼ 23 and 26, the magnetic properties obtained was better than the film grown on MgO (111) substrates. The enhancement of H c\ existed in a wide range of film thickness from 2 to 40 nm. A maximum value of H c\ of 2.7 kOe appeared in the films with thickness of 4 nm. The results of surface morphology indicated that the random distribution of the in-plane orientation of L1 1 grains induced by Pt(111) underlayer may create magnetic inhomogeneities acting as pinning site to domain walls, providing additional impedance for domain wall motion.