X-ray grating-based techniques often lead to artifacts in the phase retrieval process of phase objects presenting very fast spatial transitions or sudden jumps, especially in the field of non-destructive testing and evaluation. In this paper, we present a method that prevents the emergence of artifacts by building an interferogram corrected from any variations of the object intensity and given as input in the phase retrieval process. For illustration, this method is applied to a carbon fiber specimen imaged by a microfocus X-ray tube and a single 2D grating. A significant reduction of artifacts has been obtained, by a factor higher than 10. This evaluation has been performed experimentally thanks to the Confidence Map tool, a recently developed method that estimates the error distribution from the phase gradient information.
Le contraste de phase en imagerie par rayons X permet de voir des détails de structures dans les matériaux peu absorbants. Plusieurs techniques existent mais l’interférométrie à décalage multilatérale (IDML) permet une mesure simultanée des gradients de phase selon plusieurs directions par un post-traitement dans le domaine de Fourier. Dans cet article nous présentons des résultats de cette méthode sur deux types de matériaux, des polymères issus de fabrication additive biosourcée et des composites carbonés utilisés dans l’aéronautique. Des outils d’analyse d’image sont mis en oeuvre sur les images obtenues.
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