During the solidification of solder joints composed of near-eutectic Sn–Ag–Cu alloys, the Sn phase grows rapidly with a dendritic growth morphology, characterized by copious branching. Notwithstanding the complicated Sn growth topology, the Sn phase demonstrates single crystallographic orientations over large regions. Typical solder ball grid array joints, 900 μm in diameter, are composed of 1 to perhaps 12 different Sn crystallographic domains (Sn grains). When such solder joints are submitted to cyclic thermomechanical strains, the solder joint fatigue process is characterized by the recrystallization of the Sn phase in the higher deformation regions with the production of a much smaller grain size. Grain boundary sliding and diffusion in these recrystallized regions then leads to extensive grain boundary damage and results in fatigue crack initiation and growth along the recrystallized Sn grain boundaries.
The microstructure of the Sn-Ag-Cu solder is examined by optical microscopy and scanning electron microscopy (SEM) for various compositions near the ternary eutectic for different cooling rates from the solder melt. Focus is on the size and orientation of Sn grains as indicated by cross-polarized, light optical microscopy, and pole figures from x-ray diffraction. We find that both composition and cooling rate have strong influences on Sn grain size, with Sn grain size increasing an order of magnitude as Cu concentration increases from 0% to 1.1%. Cyclic growth twinning, with twinning angles near 60°, is observed in Sn-Ag-Cu alloys near the composition Sn-3.9Ag-0.6Cu.
The degree of undercooling of Sn in near eutectic, SnAgCu solder balls upon cooling at a rate of 1 °C/s from the melt was examined and found to increase linearly with inverse nominal sample diameter (for balls of radius between 100 and 1000 μm). The mean undercooling for SnAgCu solder balls in a flip chip assembly was 62 °C. The microstructures of these different samples were examined by means of scanning electron microscopy. The Sn dendrite arm width was observed to monotonically increase with ball diameter, indicating a possible dependence of the mechanical response of such solder balls upon size.
Grain-boundary deformation is the primary failure mode observed in solder joints. Understanding the effects of alloy composition variations and cooling rates on microstructural stability and deformation processes will allow development of improved joints. The effects of these variables on grain-boundary character were investigated in a pure-tin ingot and a reflowed sample; ingots of Sn-3.5wt.%Ag and Sn-3.8wt.%Ag-0.7wt.%Cu; and solder balls with 1.63-wt.% or 3-wt.% Ag. The microstructure was characterized using orientation imaging microscopy (OIM). After aging (150°C for 200 h), the fine-grained polycrystalline microstructure in both pure-tin specimens grew considerably, revealing preferred misorientations and ledge formation at grain boundaries. Aging of the alloy ingots showed only slight grain growth caused by precipitate pinning. The solder balls showed similar phenomena. The role of alloying elements, cooling rate, and the anisotropy of the coefficient of thermal expansion (CTE) in tin on microstructural evolution, grain-boundary character, and properties of solder joints are discussed.
A single printed circuit board includes thousands, sometimes even hundreds of thousands, of solder joints. The failure of even a single solder joint is usually enough to compromise the functionality of an electronic device or system. PbSn solder had been the standard ma te rial for these joints until various regulations around the world began to limit Pb use. SnAgCu and related alloys are quickly replacing PbSn, but much still needs to be understood and controlled. None of the paradigms for understanding the mechanical response of PbSn alloys is applicable to lead -free alloys. Much of the surprising behavior of SnAgCu solder arises from the complex and fascinating nature of its solidification behavior. In this ar ticle, the impact of solidification on the microstruc ture and therefore the mechanical properties of these solder joints will be addressed in the context of microelectronics proc essing. The need for better simulations of SnAgCu solder behavior will also be examined. Notably, modelers will have to account for a variety of new parameter dependencies not previously considered.
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