We propose an original approach to analyzing the exact solution of the direct problem in the theory of reflection that allows an algorithm for solving the inverse problem, including that in media with complex refractive indices, to be constructed. We suggest a complete set of seven observable parameters that is in a one-to-one correspondence with the complete set of structure material parameters. We derive the characteristic equation specifying the positions of the absolute minima of the reflection coefficient and the equation to calculate the layer thickness.
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