Resonant elastic X-ray scattering (REXS) offers a unique tool to investigate solid-state systems providing spatial knowledge from diffraction combined with electronic information through the enhanced absorption process, allowing the probing of magnetic, charge, spin, and orbital degrees of spatial order together with electronic structure. A new promising application of REXS is to elucidate the chiral structure of electrical polarization emergent in a ferroelectric oxide superlattice in which the polarization vectors in the REXS amplitude are implicitly described through an anisotropic tensor corresponding to the quadrupole moment. Here, we present a detailed theoretical framework and analysis to quantitatively analyze the experimental results of Ti L-edge REXS of a polar vortex array formed in a PbTiO3/SrTiO3 superlattice. Based on this theoretical framework, REXS for polar chiral structures can become a useful tool similar to x-ray resonant magnetic scattering (XRMS), enabling a comprehensive study of both electric and magnetic REXS on the chiral structures.
X-ray reflectivity (XRR) is widely used for thin-film structure analysis, and XRR data analysis involves minimizing the difference between experimental data and an XRR curve calculated from model parameters describing the thin-film structure. This analysis takes a certain amount of time because it involves many unavoidable iterations. However, the recently introduced artificial neural network (ANN) method can dramatically reduce the analysis time in the case of repeated analyses of similar samples. Here, the analysis of XRR data using a mixture density network (MDN) is demonstrated, which enables probabilistic prediction while maintaining the advantages of an ANN. First, under the assumption of a unimodal probability distribution of the output parameter, the trained MDN can estimate the best-fit parameter and, at the same time, estimate the confidence interval (CI) corresponding to the error bar of the best-fit parameter. The CI obtained in this manner is similar to that obtained using the Neumann process, a well known statistical method. Next, the MDN method provides several possible solutions for each parameter in the case of a multimodal distribution of the output parameters. An unsupervised machine learning method is used to cluster possible parameter sets in order of probability. Determining the true value by examining the candidates of the parameter sets obtained in this manner can help solve the inherent inverse problem associated with scattering data.
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