We report on the critical layer thickness of InxGa1−xAs on GaAs grown at low substrate temperatures in a wide range of indium compositions. Compared with ordinary growth conditions, the transition between pseudomorphic and relaxed regions (in the epilayer thickness versus x plane) occurred at higher indium compositions when the growth temperature was lowered. An increase in critical thicknesses for pseudomorphic growth by at least a factor of seven for alloy compositions with less than 45% indium was observed. This was determined by low temperature photoluminescence spectroscopy and transmission electron microscopy measurements on single quantum wells.
For the first time direct evidence for Mg segregation to the surface of pores within translucent polycrystalline alumina grains has been found using energy dispersive Xray spectroscopy (EDXS) and convergent beam electron diffraction (CBED) in an analytical electron microscope (AEM) on a submicrometer scale. This supports the model that MgO dopant increases the surface diffusivity which, in turn, increases the pore mobility. The MgO dopant's role in retarding grain growth in combination with the enhanced pore mobility allows the achievement of nearly full density and translucency in alumina. [
Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide grains inhibit isolation of the glass for examination. Radiofrequency plasma etching of thinned sections of 6 wt% Y2O3, 2 wt% A12O3 in Si3N4 containing 30 vol% of SiC proved to be fruitful in isolating the glass phase. A mixture of CF4 and O2 quantitatively remove the acicular nitride phase without any evidence of attack on either the glass or carbide. Composites containing ceria and magnesia as substitutes for yttria behave similarly. This indicates that glasses containing minor to major concentrations of elements forming stable fluorides inhibit the attack of fluoride ions on silica glasses containing these elements.
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