The influence of two UV photostabilizers on the photostability of Polyethylene-co-CHDM-terephthalate (PETG) and Polycyclohexylenedimethylene-Co-TMCD-terephthalate (PCTT) copolyester films was investigated. Untreated films and films containing stabilizer were irradiated. The resulting films were analyzed by attenuated total reflectance Fourier transform infrared (ATR FTIR) spectroscopy, gel permeation chromatography (GPC), and X-ray photoelectron spectroscopy (XPS). FTIR spectra of the irradiated films containing Cyasorb 1164 showed less change in intensity of the broad peak corresponding to OH groups, than the films containing Cyasorb 3638, indicating that Cyasorb 1164 is a better photostabilizer for these films. XPS results showed that the decrease in C/O ratio, due to photodegradation, was greater in films containing Cyasorb 3638 compared to those containing Cyasorb 1164. The formation of degradation products was evident from emission spectra arising from extracts of irradiated films based on PCTT +10% Cyasorb 3638, but no degradation products were apparent in extracts from irradiated PCTT +10% Cyasorb 1164. UV-absorption spectra of Cyasorb 1164 overlap more substantially with the absorption spectra of PETG and PCTT. The results from FTIR, XPS, and GPC analyses of the irradiated PETG and PCTT films demonstrated that Cyasorb 1164 was more effective than Cyasorb 3638 in enhancing resistance to UV-induced weathering.
The photodegradation of copolyesters based on 1,4-cyclohexanedimethanol (CHDM), tetramethyl-1,3-cyclobutanediol, and terephthalic acid units was investigated using various analytical methods. Photodegradation products were characterized using Fourier transform infrared (FTIR), liquid chromatography-mass spectrometry (LC-MS), and X-ray Photoelectron spectroscopy (XPS) analysis. The homolytic scission of C-O bonds of ester groups through a Norrish Type I reaction was supported by time of flight secondary ion mass spectrometry and LC-MS results, while nuclear magnetic resonance analysis confirmed hydrogen abstraction from the tertiary carbon of CHDM units in the trans (equatorial-equatorial) conformation. Chain scission through Norrish Type II reaction is also responsible for the formation of carboxylic acid end group. Fluorescence emission from irradiated glycol modified poly(ethylene terephthalate) films demonstrated the formation of mono-and dihydroxyterephthalate species. Furthermore, FTIR and XPS valence band analysis confirmed configurational changes, in the polymer chain due to photodegradation.
The photodegradation of irradiated PETG and PCCT model compounds namely Tm‐CHDM‐Tm and Tm‐TMCD‐Tm, where Tm refers to the methyl ester of terephthalic acid, CHDM refers to 1, 4‐cyclohexanedimethanol, and TMCD refers to tetramethyl‐1, 3‐cyclobutanediol, was analyzed using X‐ray photoelectron spectroscopy. Photodegradation products were characterized based on high resolution O1s x‐ray photoelectron spectroscopy (XPS) spectra and the spectra of irradiated model compounds showed a decrease in the relative intensity of CO compared to the CO peak. The percentage of CO formation in irradiated model compounds changed in proportion to irradiation time and showed that the model compound containing CHDM was slightly more UV stable than the TMCD based model compound. Photodegradation mechanisms for model compounds were proposed based on XPS spectra. In parallel studies, density functional theory calculations were performed as an approach to predict degradation products, to help interpreting the XPS spectra of model compounds and characterize the reactivity of model compounds.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.