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Structure and morphology play a critical role in determining the performance of organic photovoltaic devices. In this paper, variation of the postannealing cooling rate is used to create a series of “snapshots” of the vertical and interfacial reorganization processes that occur upon annealing. The data show that slower cooling rates result in significantly enhanced device efficiencies primarily driven by increased short circuit current and fill factor. UV−vis spectroscopy, X-ray diffraction (XRD), near-edge X-ray absorption fine structure spectroscopy (NEXAFS), atomic force microscopy (AFM), and contact angle measurements are used to probe the origin of these improvements. Our results show evidence for a distinct and changing vertical stratification and interfacial structure in the device throughout the annealing process, with both composition and crystallinity varying through the active layer. The implications of these changes are discussed in terms of device properties.

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A large number of flexible polymer solar modules comprising 16 serially connected individual cells was prepared at the experimental workshop at Risø DTU. The photoactive layer was prepared from several varieties of P3HT (Merck, Plextronics, BASF and Risø DTU) and two varieties of ZnO (nanoparticulate, thin film) were employed as electron transport layers. The devices were all tested at Risø DTU and the functional devices were subjected to an inter-laboratory study involving the performance and the stability of modules over time in the dark, under light soaking and outdoor conditions. 24 laboratories from 10 countries and across four different continents were involved in the studies. The reported results allowed for analysis of the variability between different groups in performing lifetime studies as well as performing a comparison of different testing procedures. These studies constitute the first steps toward establishing standard procedures for an OPV lifetime charac terization