The results of recent research on synthetic electro -optic imaging using a Linnik interference microscope are presented. A new technique is used in which images are produced by calculating the degree of coherence between corresponding pixels in the object and reference image planes of the Linnik microscope.Each pixel in the synthetic image is a function of this degree of coherence.This amounts to what one might call "Coherence Probe Imaging."The images have the properties that all parts of the object which are out of focus appear dark, those in focus appear bright, and the depth of focus is very narrow. Three dimensional images can be produced by moving the object in the vertical direction and recording a number of optical sections of the image.Theoretical analyses and experimental results are presented. A model for the performance of the coherence probe microscope is first developed and then its performance is compared with that of a standard microscope and of a confocal laser scanning microscope within the context of this model.
Broad beam ion sources have been employed to remove material from (or deposit materials onto) optical surfaces in a highly controlled fashion without mechanically contacting the optic surface. Thus, ion processing techniques should be applicable for figuring high energy laser mirrors. The topographical etching and deposition facility at TRW has been used for etching laser gratings, which illustrate processing capabilities demonstrated to date. The facility includes a 10 cm diameter argon ion source, typically operated at 1000 eV and 1 mA /cm2, microprocessor controlled x -y translation tables, and associated vacuum equipment, fixturing, and electronics. Etch depth control to better than 100 A at 4.2 micrometers groove spacing was achieved on molybdenum mirrors weighing up to 150 pounds.
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